Experimental x-ray diffraction techniques for microstructural analysis of materials, emphasizing powder and single-crystal techniques. Diffraction from epitaxial and polycrystalline thin films, multilayers, and amorphorous materials using medium and high resolution configurations. Determination of phase purity, crystallinity, relaxation, stress, and texture in the materials. Advanced experimental x-ray diffraction techniques: reciprocal lattice mapping, reflectivity, and grazing incidence diffraction. Enrollment limited to PHOTON 20. Undergraduates register for PHOTON 162 for 4 units; graduates register for PHOTON 172 for 3 units. Prerequisites: MATSCI PHOTON 143 or equivalent course in materials characterization.Corequisites: MATSCI131 (Contact the instructor if you would like to enroll without completion of the stated prerequisites. A permission code will be provided with instructor approval)
3-4 units · Letter or Credit/No Credit
Experimental x-ray diffraction techniques for microstructural analysis of materials, emphasizing powder and single-crystal techniques. Diffraction from epitaxial and polycrystalline thin films, multilayers, and amorphorous materials using medium and high resolution configurations. Determination of phase purity, crystallinity, relaxation, stress, and texture in the materials. Advanced experimental x-ray diffraction techniques: reciprocal lattice mapping, reflectivity, and grazing incidence diffraction. Enrollment limited to 20. Undergraduates register for 162 for 4 units; graduates register for 172 for 3 units. Prerequisites: MATSCI 143 or equivalent course in materials characterization.Corequisites: MATSCI131 (Contact the instructor if you would like to enroll without completion of the stated prerequisites. A permission code will be provided with instructor approval)
Offered in Spring 2026 at Stanford University.